Series resistance degradation due to NBTI in PMOSFET. - Mahesh S. Krishnan; Viktor Kol'dyaev; Eiji Morifoji; Koji Miyamoto; Tomasz Brozek; Xiaolei Li (Microelectron. Reliab., 2002)

Editorial. - Tomasz Brozek (Microelectron. Reliab., 2005)

In-Product BTI Aging Sensor for Reliability Screening and Early Detection of Material at Risk. - Tomasz Brozek; Alberto A. P. Cattaneo; Larg Weiland; Michele Quarantelli; Alberto Coccoli; Sharad Saxena; Christopher Hess; Andrzej J. Strojwas (IRPS, 2023)

Short-Flow Compatible Wafer-Level Reliability Assessment and Monitoring for PCM Embedded Non-Volatile Memory. - Meindert Lunenborg; Tomasz Brozek; Laura Lorenzi; Christoph Dolainsky; Violet Liu; Xiaoyi Feng (IRPS, 2023)

Advanced Silicon Technologies: Design Consequences of Scaling Solutions for Devices. - Tomasz Brozek (MIXDES, 2024)

Impact of the Inter-Fin Space on Stress Modulation and FinFET Transistor Performance. - Angelo Rossoni; Tomasz Brozek; Sharad Saxena; Rajesh Khamankar; Zsolt Miklós Kovács-Vajna (ICICDT, 2025)