CMOS Standard Cells Characterization for Defect Based Testing. - Witold A. Pleskacz; Dominik Kasprowicz; Tomasz Oleszczak; Wieslaw Kuzmicz (DFT, 2001)

Polarization-versed calibration of spectrophotometric transducers. - Roman Z. Morawski; Andrzej Miekina; Tomasz Oleszczak; Andrzej Barwicz (IEEE Trans. Instrum. Meas., 2003)