Wide frequency range ac electrical characterization of thick-film microvaristors. - M. W. Dudek; Karol Nitsch; Andrzej Dziedzic; Tomasz Piasecki (Microelectron. Reliab., 2011)

Electrical characterization of aluminium oxide-aluminium thin film composites by impedance spectroscopy. - Katarzyna Tadaszak; Karol Nitsch; Tomasz Piasecki; Witold M. Posadowski (Microelectron. Reliab., 2011)

Performance Evaluation of Miniature Integrated Electrochemical Cells Fabricated Using LTCC Technology. - Paulina Szymanowska; Damian Nowak; Tomasz Piasecki (Sensors, 2019)

On Strong Dynamics of Compressible Two-Component Mixture Flow. - Tomasz Piasecki; Yoshihiro Shibata; Ewelina Zatorska (SIAM J. Math. Anal., 2019)

Digital Analysis of Damped Vibrations. - René Laflamme; Piotr Putek; Tomasz Piasecki; Teodor P. Gotszalk (IEEE Instrum. Meas. Mag., 2024)

Conductive Atomic Force Microscopy - Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties. - Andrzej Sikora; Krzysztof Gajewski; Dominik Badura; Bartosz Pruchnik; Tomasz Piasecki; Kamil Raczkowski; Teodor P. Gotszalk (Sensors, 2024)

Miniaturized Transformer Bridge Setup for Scanning Thermal Microscopy Applications. - Piotr Smagowski; Tomasz Piasecki; Maciej Rudek (IEEE Trans. Instrum. Meas., 2025)