Image Based Analysis of Complex Microstructures of Engineering Materials. - Tomasz Wejrzanowski; Wojciech Leon Spychalski; Krzysztof Rózniatowski; Krzysztof Jan Kurzydlowski (Int. J. Appl. Math. Comput. Sci., 2008)

Design of SiC-Doped Piezoresistive Pressure Sensor for High-Temperature Applications. - Tomasz Wejrzanowski; Emil Tymicki; Tomasz Plocinski; Janusz Józef Bucki; Teck Leong Tan (Sensors, 2021)