Simulation of ESD protection devices in an advanced CMOS technology using a TCAD workbench based on an ESD calibration methodology. - Tommaso Cilento; M. Schenkel; C. Yun; R. Mishra; Junjun Li; Kiran V. Chatty; Robert Gauthier 002 (Microelectron. Reliab., 2010)

Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation. - Tommaso Cilento; Chan-Su Yun; Arsen Terterian; Chang Hwi Lee; Jung Eon Moon; Si Woo Lee; Hyoungcheol Kwon; Manho Seung; Seokkiu Lee (Microelectron. Reliab., 2018)