Ultra Long-term Measurement Results of BTI-induced Aging Degradation on 7-nm Ring Oscillators. - Kazutoshi Kobayashi; Tomoharu Kishita; Hiroki Nakano; Jun Furuta; Mitsuhiko Igarashi; Shigetaka Kumashiro; Michitarou Yabuuchi; Hironori Sakamoto (IRPS, 2023)

Investigation of the Time-Dependent BTI-induced Degradation Distribution for Ring Oscillators in Ultra-Long-Term Stress Conditions. - Tomoharu Kishita; Ryo Kishida; Kazutoshi Kobayashi (IRPS, 2025)