Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST. - Senling Wang; Tomoki Aono; Yoshinobu Higami; Hiroshi Takahashi; Hiroyuki Iwata; Yoichi Maeda; Jun Matsushima (ATS, 2018)

FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST. - Hanan T. Al-Awadhi; Tomoki Aono; Senling Wang; Yoshinobu Higami; Hiroshi Takahashi; Hiroyuki Iwata; Yoichi Maeda; Jun Matsushima (IEICE Trans. Inf. Syst., 2020)