Hybrid test application in hybrid delay scan design. - Yuki Yoshikawa; Tomomi Nuwa; Hideyuki Ichihara; Tomoo Inoue (ETS, 2010)

Hybrid Test Application in Partial Skewed-Load Scan Design. - Yuki Yoshikawa; Tomomi Nuwa; Hideyuki Ichihara; Tomoo Inoue (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2011)