Extending the fatigue life of Pb-free SAC solder joints under thermal cycling. - Shoho Ishikawa; Hironori Tohmyoh; Satoshi Watanabe; Tomonori Nishimura; Yoshikatsu Nakano (Microelectron. Reliab., 2013)

Design and demonstration of reliability-aware Ge gate stacks with 0.5 nm EOT. - Cimang Lu; Choong Hyun Lee; Tomonori Nishimura; Akira Toriumi (VLSIC, 2015)