Effect of imbalance in activities between ON- and OFF-center LGN cells on orientation map formation. - Hayato Nakagama; Tomoya Saito; Shigeru Tanaka (Biol. Cybern., 2000)

Flexible Framework for Time-Series Pattern Matching over Multi-dimension Data Stream. - Takuya Kida; Tomoya Saito; Hiroki Arimura (PAKDD Workshops, 2008)

Algorithms for Finding a Minimum Repetition Representation of a String. - Atsuyoshi Nakamura; Tomoya Saito; Ichigaku Takigawa; Hiroshi Mamitsuka; Mineichi Kudo (SPIRE, 2010)

Fast algorithms for finding a minimum repetition representation of strings and trees. - Atsuyoshi Nakamura; Tomoya Saito; Ichigaku Takigawa; Mineichi Kudo; Hiroshi Mamitsuka (Discret. Appl. Math., 2013)

A 28 nm Embedded Split-Gate MONOS (SG-MONOS) Flash Macro for Automotive Achieving 6.4 GB/s Read Throughput by 200 MHz No-Wait Read Operation and 2.0 MB/s Write Throughput at Tj of 170°C. - Yasuhiko Taito; Takashi Kono; Masaya Nakano; Tomoya Saito; Takashi Ito; Kenji Noguchi; Hideto Hidaka; Tadaaki Yamauchi (IEEE J. Solid State Circuits, 2016)

Overview of Embedded Flash Memory Technology. - Takashi Kono; Tomoya Saito; Tadaaki Yamauchi (Embedded Flash Memory for Embedded Systems, 2018)

A 22nm 32Mb Embedded STT-MRAM Macro Achieving 5.9ns Random Read Access and 5.8MB/s Write Throughput at up to Tj of 150 °C. - Takahiro Shimoi; Ken Matsubara; Tomoya Saito; Tomoya Ogawa; Yasuhiko Taito; Yoshinobu Kaneda; Masayuki Izuna; Koichi Takeda; Hidenori Mitani; Takashi Ito; Takashi Kono (VLSI Technology and Circuits, 2022)

15.8 A 22nm 10.8Mb Embedded STT-MRAM Macro Achieving over 200MHz Random-Read Access and a 10.4MB/s Write Throughput with an In-Field Programmable 0.3Mb MTJ-OTP for High-End MCUs. - Tomoya Ogawa; Ken Matsubara; Yasuhiko Taito; Tomoya Saito; Masayuki Izuna; Koichi Takeda; Yoshinobu Kaneda; Takahiro Shimoi; Hidenori Mitani; Takashi Ito; Takashi Kono (ISSCC, 2024)

A 22-nm 32-Mb Embedded STT-MRAM Macro Achieving 5.9-ns Random Read Access and 7.4-MB/s Write Throughput at up to 150 °C. - Takahiro Shimoi; Ken Matsubara; Tomoya Saito; Tomoya Ogawa; Yasuhiko Taito; Yoshinobu Kaneda; Masayuki Izuna; Koichi Takeda; Hidenori Mitani; Takashi Ito; Takashi Kono (IEEE J. Solid State Circuits, 2024)