Characterization of interface state density of three-dimensional Si nanostructure by charge pumping measurement. - Chunmeng Dou; Tomoya Shoji; Kazuhiro Nakajima; Kuniyuki Kakushima; Parhat Ahmet; Yoshinori Kataoka; Akira Nishiyama; Nobuyuki Sugii; Hitoshi Wakabayashi; Kazuo Tsutsui; Kenji Natori; Hiroshi Iwai (Microelectron. Reliab., 2014)