Data Analysis Technique of Atomic Force Microscopy for Atomically Flat Silicon Surfaces. - Masahiro Konda; Akinobu Teramoto; Tomoyuki Suwa; Rihito Kuroda; Tadahiro Ohmi (IEICE Trans. Electron., 2009)

Influence of Si Surface Roughness on Electrical Characteristics of MOSFET with HfON Gate Insulator Formed by ECR Plasma Sputtering. - Dae-Hee Han; Shun'ichiro Ohmi; Tomoyuki Suwa; Philippe Gaubert; Tadahiro Ohmi (IEICE Trans. Electron., 2014)

An Electrical Impedance Biosensor Array for Tracking Moving Cells. - Norichika Ogata; Akihisa Shina; Takayuki Komiya; Yoji Iizuka; Ken Matsuse; Fuminobu Imaizumi; Tomoyuki Suwa; Akinobu Teramoto (IEEE SENSORS, 2018)

Reliability of MgO in magnetic tunnel junctions formed by MgO sputtering and Mg oxidation. - Akinobu Teramoto; Keiichi Hashimoto; Tomoyuki Suwa; Jun-ichi Tsuchimoto; Marie Hayashi; Hyeonwoo Park; Shigetoshi Sugawa (IRPS, 2018)

Effect of Drain-to-Source Voltage on Random Telegraph Noise Based on Statistical Analysis of MOSFETs with Various Gate Shapes. - Ryo Akimoto; Rihito Kuroda; Akinobu Teramoto; Takezo Mawaki; Shinya Ichino; Tomoyuki Suwa; Shigetoshi Sugawa (IRPS, 2020)