Nonisothermal device simulation using the 2D numerical process/device simulator TRENDY and application to SOI-devices. - Philip B. M. Wolbert; Gerhard K. M. Wachutka; Benno H. Krabbenborg; Ton J. Mouthaan (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1994)

Layout to circuit extraction for three-dimensional thermal-electrical circuit simulation of device structures. - Benno H. Krabbenborg; A. Bosma; Henk C. de Graaff; Ton J. Mouthaan (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996)

Investigations on double-diffused MOS transistors under ESD zap conditions. - Gianluca Boselli; Stan Meeuwsen; Ton J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2001)

The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin-film transistors. - N. Tosic Golo; S. van der Wal; Fred G. Kuper; Ton J. Mouthaan (Microelectron. Reliab., 2001)

Competencies of BSc and MSc Programmes in Electrical Engineering and Student Portfolios. - Ton J. Mouthaan; R. W. Brink; Henk Vos (DELTA, 2002)

Zapping thin film transistors. - N. Tosic Golo; Fred G. Kuper; Ton J. Mouthaan (Microelectron. Reliab., 2002)

Fast temperature cycling and electromigration induced thin film cracking in multilevel interconnection: experiments and modeling. - H. V. Nguyen; Cora Salm; J. Vroemen; J. Voets; Benno Krabbenborg; Jaap Bisschop; A. J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2002)

Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime. - H. V. Nguyen; Cora Salm; R. Wenzel; A. J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2002)

The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress. - M. S. B. Sowariraj; Theo Smedes; Cora Salm; Ton J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2002)

Competence-Based EE-Learning: (How) Can We Implement It? - Ton J. Mouthaan; Wouter Olthuis; Henk Vos (MSE, 2003)

Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy. - M. S. B. Sowariraj; Theo Smedes; Cora Salm; Ton J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2003)

A Case Study of a Microsystems MSc Curriculum. - Ton J. Mouthaan (DELTA, 2004)

A 3-D Circuit Model to evaluate CDM performance of ICs. - M. S. B. Sowariraj; Theo Smedes; Peter C. de Jong; Cora Salm; Ton J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2005)

Internationalisation of Masters education; globalisation at work. - Ton J. Mouthaan; Anke Kohl (DELTA, 2006)

CreaTe: A New Programme to Attract Engineers as Design Artists. - Zsófia Ruttkay; Ton J. Mouthaan (DELTA, 2008)

Editorial. - Guido Groeseneken; Ingrid De Wolf; A. J. Mouthaan; Jaap Bisschop (Microelectron. Reliab., 2008)