Evolution of microstructure and failure mechanism of lead-free solder interconnections in power cycling and thermal shock tests. - Tomi Laurila; Toni T. Mattila; Vesa Vuorinen; Juha Karppinen; Jue Li; Mika Sippola; Jorma K. Kivilahti (Microelectron. Reliab., 2007)

A novel impact test system for more efficient reliability testing. - Jussi Hokka; Toni T. Mattila; Jue Li; Jarmo Teeri; Jorma K. Kivilahti (Microelectron. Reliab., 2010)

Thermomechanical reliability characterization of a handheld product in accelerated tests and use environment. - Juha Karppinen; Jue Li; Toni T. Mattila; Mervi Paulasto-Kröckel (Microelectron. Reliab., 2010)

FEM simulations for reliability assessment of component boards drop tested at various temperatures. - J. Li; Toni T. Mattila; H. Xu; Mervi Paulasto (Simul. Model. Pract. Theory, 2010)

Toward comprehensive reliability assessment of electronics by a combined loading approach. - Toni T. Mattila; Mervi Paulasto-Kröckel (Microelectron. Reliab., 2011)

The reliability of component boards studied with different shock impact repetition frequencies. - Jussi Hokka; Jue Li; Toni T. Mattila; Mervi Paulasto-Kröckel (Microelectron. Reliab., 2012)

Shock impact reliability characterization of a handheld product in accelerated tests and use environment. - Juha Karppinen; Jue Li; J. Pakarinen; Toni T. Mattila; Mervi Paulasto-Kröckel (Microelectron. Reliab., 2012)

On the effects of temperature on the drop reliability of electronic component boards. - Toni T. Mattila; Jue Li; Jorma K. Kivilahti (Microelectron. Reliab., 2012)

Reliability assessment of a MEMS microphone under mixed flowing gas environment and shock impact loading. - Jue Li; Mikael Broas; Jani Raami; Toni T. Mattila; Mervi Paulasto-Kröckel (Microelectron. Reliab., 2014)

An approach to adjust the board-level drop test conditions to improve the correlation with product-level drop impact. - Toni T. Mattila; Heikki Ruotoistenmäki; Jani Raami; Jussi Hokka; Manu Mäkelä; Esa Hussa; Markku Sillanpää; Ville Halkola (Microelectron. Reliab., 2014)

Evaluation of the drop response of handheld electronic products. - Toni T. Mattila; Laura Vajavaara; Jussi Hokka; Esa Hussa; Manu Mäkelä; Ville Halkola (Microelectron. Reliab., 2014)