eNVM RRAM reliability performance and modeling in 22FFL FinFET technology. - Yao-Feng Chang; James A. O'Donnell; Tony Acosta; Roza Kotlyar; Albert B. Chen; Pedro A. Quintero; Nathan Strutt; Oleg Golonzka; Chris Connor; Jeff Hicks (IRPS, 2020)

A Reliability Overview of Intel's 10+ Logic Technology. - Rohit Grover; Tony Acosta; C. AnDyke; Emre Armagan; C. Auth; Sunny Chugh; K. Downes; M. Hattendorf; N. Jack; S. Joshi; R. Kasim; Gerald S. Leatherman; et al. (IRPS, 2020)

Embedded emerging memory technologies for neuromorphic computing: temperature instability and reliability. - Yao-Feng Chang; Ilya Karpov; Reed Hopkins; David Janosky; Jacob Medeiros; Benjamin Sherrill; Jiahan Zhang; Yifu Huang; Tanmoy Pramanik; Albert B. Chen; Tony Acosta; Abdullah Guler; et al. (IRPS, 2021)