Introduction. - Magdy S. Abadir; Tony Ambler (J. Electron. Test., 1994)

Design and Test Economics-An Extra Dimension. - Tony Ambler; Magdy S. Abadir (IEEE Des. Test Comput., 1997)

Guest Editors' Introduction: Test and the Product Life Cycle. - Tony Ambler; Ben Bennetts (IEEE Des. Test Comput., 1999)

Robust transition density estimation by considering input/output transition behavior. - Dongho Kim; Tony Ambler (ISCAS (5), 2001)

Test Strategies and Marriage Partners. - Tony Ambler (IEEE Des. Test Comput., 2001)

Test Trade-Offs Take Center Stage at ITC. - Tony Ambler; Donald L. Wheater (IEEE Des. Test Comput., 2001)

Economics of Built-in Self-Test. - Louis Y. Ungar; Tony Ambler (IEEE Des. Test Comput., 2001)

The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time. - Il-soo Lee; Yong Min Hur; Tony Ambler (Asian Test Symposium, 2004)

Maintenance policy designs for PC manufacturers. - Yu-Ting Lin 004; Tony Ambler (CCA, 2005)

Two efficient methods to reduce power and testing time. - Il-soo Lee; Tony Ambler (ISLPED, 2005)

Cost-effective designs of field service for electronic systems. - Yu-Ting Lin 004; David Williams; Tony Ambler (ITC, 2005)

A knowledge-based dispatching model for field service. - Yu-Ting Lin 004; Tony Ambler (SMC, 2005)

An Economic Selecting Model for DFT Strategies. - Yu-Ting Lin 004; Tony Ambler (VTS, 2005)

An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint. - Geewhun Seok; Il-soo Lee; Tony Ambler; Baxter F. Womack (DFT, 2006)