Logic BIST for large industrial designs: real issues and case studies. - Graham Hetherington; Tony Fryars; Nagesh Tamarapalli; Mark Kassab; Abu S. M. Hassan; Janusz Rajski (ITC, 1999)

Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. - Kenneth M. Butler; Jayashree Saxena; Tony Fryars; Graham Hetherington (ITC, 2004)