Functional testing techniques for digital LSI/VLSI systems. - Stephen Y. H. Su; Tonysheng Lin (DAC, 1984)

Functional Test Generation of Digital LSI/VLSI Systems Using Machine Symbolic Execution Technique. - Tonysheng Lin; Stephen Y. H. Su (ITC, 1984)

VLSI Functional Test Pattern Generation: A Design and Implementation. - Tonysheng Lin; Stephen Y. H. Su (ITC, 1985)

The S-Algorithm: A Promising Solution for Systematic Functional Test Generation. - Tonysheng Lin; Stephen Y. H. Su (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1985)

Designing circuits with partial scan. - Vishwani D. Agrawal; Kwang-Ting Cheng; Daniel D. Johnson 004; Tonysheng Lin (IEEE Des. Test, 1988)