A layout checking system for large scale integrated circuits. - Kenji Yoshida; Takashi Mitsuhashi; Yasuo Nakada; Toshiaki Chiba; Kiyoshi Ogita; Shinji Nakatsuka (DAC, 1977)

An integrated mask artwork analysis system. - Takashi Mitsuhashi; Toshiaki Chiba; Makoto Takashima; Kenji Yoshida (DAC, 1980)

Programs for verifying circuit connectivity of mos/lsi mask artwork. - Makoto Takashima; Takashi Mitsuhashi; Toshiaki Chiba; Kenji Yoshida (DAC, 1982)

An STD system for OOV query terms using various subword units. - Hiroyuki Saito; Takuya Nakano; Shiro Narumi; Toshiaki Chiba; Kazuma Konno; Yoshiaki Itoh 001 (NTCIR, 2011)