A 113mm2 32Gb 3b/cell NAND flash memory. - Takuya Futatsuyama; Norihiro Fujita; Naoya Tokiwa; Yoshihiko Shindo; Toshiaki Edahiro; Teruhiko Kamei; Hiroaki Nasu; Makoto Iwai; Koji Kato; Yasuyuki Fukuda; Naoaki Kanagawa; Naofumi Abiko; et al. (ISSCC, 2009)

A 19nm 112.8mm2 64Gb multi-level flash memory with 400Mb/s/pin 1.8V Toggle Mode interface. - Noboru Shibata; Kazushige Kanda; Toshiki Hisada; Katsuaki Isobe; Manabu Sato; Yui Shimizu; Takahiro Shimizu; Takahiro Sugimoto; Tomohiro Kobayashi; Kazuko Inuzuka; Naoaki Kanagawa; Yasuyuki Kajitani; et al. (ISSCC, 2012)

A 19 nm 112.8 mm2 64 Gb Multi-Level Flash Memory With 400 Mbit/sec/pin 1.8 V Toggle Mode Interface. - Kazushige Kanda; Noboru Shibata; Toshiki Hisada; Katsuaki Isobe; Manabu Sato; Yui Shimizu; Takahiro Shimizu; Takahiro Sugimoto; Tomohiro Kobayashi; Naoaki Kanagawa; Yasuyuki Kajitani; Takeshi Ogawa; et al. (IEEE J. Solid State Circuits, 2013)

A 512Gb 3b/Cell 3D flash memory on a 96-word-line-layer technology. - Hiroshi Maejima; Kazushige Kanda; Susumu Fujimura; Teruo Takagiwa; Susumu Ozawa; Jumpei Sato; Yoshihiko Shindo; Manabu Sato; Naoaki Kanagawa; Junji Musha; Satoshi Inoue; Katsuaki Sakurai; et al. (ISSCC, 2018)

A 1.33Tb 4-bit/Cell 3D-Flash Memory on a 96-Word-Line-Layer Technology. - Noboru Shibata; Kazushige Kanda; Takahiro Shimizu; Jun Nakai; Osamu Nagao; Naoki Kobayashi 004; Makoto Miakashi; Yasushi Nagadomi; Takeshi Nakano; Takahisa Kawabe; Taira Shibuya; Mario Sako; et al. (ISSCC, 2019)

A 1.33-Tb 4-Bit/Cell 3-D Flash Memory on a 96-Word-Line-Layer Technology. - Noboru Shibata; Takahisa Kawabe; Taira Shibuya; Mario Sako; Kosuke Yanagidaira; Toshifumi Hashimoto; Hiroki Date; Manabu Sato; Tomoki Nakagawa; Junji Musha; Takatoshi Minamoto; Kazushige Kanda; et al. (IEEE J. Solid State Circuits, 2020)

30.4 A 1Tb 3b/Cell 3D-Flash Memory in a 170+ Word-Line-Layer Technology. - Tsutomu Higuchi; Takuyo Kodama; Koji Kato; Ryo Fukuda; Naoya Tokiwa; Mitsuhiro Abe; Teruo Takagiwa; Yuki Shimizu; Junji Musha; Katsuaki Sakurai; Jumpei Sato; Tetsuaki Utsumi; et al. (ISSCC, 2021)