Multi-Step Word-Line Control Technology in Hierarchical Cell Architecture for Scaled-Down High-Density SRAMs. - Koichi Takeda 001; Toshio Saito; Shinobu Asayama; Yoshiharu Aimoto; Hiroyuki Kobatake; Shinya Ito; Toshifumi Takahashi; Masahiro Nomura; Kiyoshi Takeuchi; Yoshihiro Hayashi (IEEE J. Solid State Circuits, 2011)