Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variations in SoCs. - Mitsuya Fukazawa; Tetsuro Matsuno; Toshifumi Uemura; Rei Akiyama; Tetsuya Kagemoto; Hiroshi Makino; Hidehiro Takata; Makoto Nagata (ISSCC, 2007)

10.2 A 28nm HPM heterogeneous multi-core mobile application processor with 2GHz cores and low-power 1GHz cores. - Mitsuhiko Igarashi; Toshifumi Uemura; Ryo Mori; Noriaki Maeda; Hiroshi Kishibe; Midori Nagayama; Masaaki Taniguchi; Kohei Wakahara; Toshiharu Saito; Masaki Fujigaya; Kazuki Fukuoka; Koji Nii; et al. (ISSCC, 2014)

A 28 nm High-k/MG Heterogeneous Multi-Core Mobile Application Processor With 2 GHz Cores and Low-Power 1 GHz Cores. - Mitsuhiko Igarashi; Toshifumi Uemura; Ryo Mori; Hiroshi Kishibe; Midori Nagayama; Masaaki Taniguchi; Kohei Wakahara; Toshiharu Saito; Masaki Fujigaya; Kazuki Fukuoka; Koji Nii; Takeshi Kataoka; et al. (IEEE J. Solid State Circuits, 2015)

A 28nm fully digital voltage monitor with 16.5uV/°C accuracy and 0.8mV quantized error from -40 to 160°C for ISO26262 ASIL-D capable MCU. - Toshifumi Uemura; Yuko Kitaji; Kazuki Fukuoka (A-SSCC, 2019)