Accurate analysis of substrate sensitivity of active transistors in an analog circuit. - Satoshi Takaya; Yoji Bando; Toru Ohkawa; Toshiharu Takaramoto; Toshio Yamada; Masaaki Souda; Shigetaka Kumashiro; Tohru Mogami; Makoto Nagata (ISQED, 2011)

A Continuous-Time Waveform Monitoring Technique for On-Chip Power Noise Measurements in VLSI Circuits. - Yoji Bando; Satoshi Takaya; Toru Ohkawa; Toshiharu Takaramoto; Toshio Yamada; Masaaki Souda; Shigetaka Kumashiro; Tohru Mogami; Makoto Nagata (IEICE Trans. Electron., 2011)

On-Chip Single Tone Pseudo-Noise Generator for Analog IP Noise Tolerance Measurement. - Masaaki Souda; Yoji Bando; Satoshi Takaya; Toru Ohkawa; Toshiharu Takaramoto; Toshio Yamada; Shigetaka Kumashiro; Tohru Mogami; Makoto Nagata (IEICE Trans. Electron., 2011)

On-Chip In-Place Measurements of Vth and Signal/Substrate Response of Differential Pair Transistors. - Yoji Bando; Satoshi Takaya; Toru Ohkawa; Toshiharu Takaramoto; Toshio Yamada; Masaaki Souda; Shigetaka Kumashiro; Tohru Mogami; Makoto Nagata (IEICE Trans. Electron., 2012)

Measurements and Simulation of Sensitivity of Differential-Pair Transistors against Substrate Voltage Variation. - Satoshi Takaya; Yoji Bando; Toru Ohkawa; Toshiharu Takaramoto; Toshio Yamada; Masaaki Souda; Shigetaka Kumashiro; Tohru Mogami; Makoto Nagata (IEICE Trans. Electron., 2013)