A Continuous-Adaptive DDR2 Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test. - Masaru Haraguchi; Tokuya Osawa; Akira Yamazaki; Chikayoshi Morishima; Toshinori Morihara; Yoshikazu Morooka; Yoshihiro Okuno; Kazutami Arimoto (ISSCC, 2007)

A Continuous-Adaptive DDRx Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test. - Masaru Haraguchi; Tokuya Osawa; Akira Yamazaki; Chikayoshi Morishima; Toshinori Morihara; Yoshikazu Morooka; Yoshihiro Okuno; Kazutami Arimoto (IEICE Trans. Electron., 2009)