A 45nm Low-Standby-Power Embedded SRAM with Improved Immunity Against Process and Temperature Variations. - Makoto Yabuuchi; Koji Nii; Yasumasa Tsukamoto; Shigeki Ohbayashi; Susumu Imaoka; Hiroshi Makino; Yoshinobu Yamagami; Satoshi Ishikura; Toshio Terano; Toshiyuki Oashi; Keiji Hashimoto; Akio Sebe; et al. (ISSCC, 2007)

A 45 nm 2-port 8T-SRAM Using Hierarchical Replica Bitline Technique With Immunity From Simultaneous R/W Access Issues. - Satoshi Ishikura; Marefusa Kurumada; Toshio Terano; Yoshinobu Yamagami; Naoki Kotani; Katsuji Satomi; Koji Nii; Makoto Yabuuchi; Yasumasa Tsukamoto; Shigeki Ohbayashi; Toshiyuki Oashi; Hiroshi Makino; et al. (IEEE J. Solid State Circuits, 2008)

A 45-nm Bulk CMOS Embedded SRAM With Improved Immunity Against Process and Temperature Variations. - Koji Nii; Makoto Yabuuchi; Yasumasa Tsukamoto; Shigeki Ohbayashi; Susumu Imaoka; Hiroshi Makino; Yoshinobu Yamagami; Satoshi Ishikura; Toshio Terano; Toshiyuki Oashi; Keiji Hashimoto; Akio Sebe; et al. (IEEE J. Solid State Circuits, 2008)

A 2.97μm-Pitch Event-Based Vision Sensor with Shared Pixel Front-End Circuitry and Low-Noise Intensity Readout Mode. - Atsumi Niwa; Futa Mochizuki; Raphael Berner; Takuya Maruyarma; Toshio Terano; Kenichi Takamiya; Yasutaka Kimura; Kyoji Mizoguchi; Takahiro Miyazaki; Shun Kaizu; Hirotsugu Takahashi; Atsushi Suzuki; et al. (ISSCC, 2023)