Experiment on digital CDS with 33-M pixel 120-fps super hi-vision image sensor. - Jun Yonai; Toshio Yasue; Kazuya Kitamura; Tetsuya Hayashida; Toshihisa Watabe; Hiroshi Shimamoto; Shoji Kawahito (IMSE, 2014)

6.9 A 1.1µm 33Mpixel 240fps 3D-stacked CMOS image sensor with 3-stage cyclic-based analog-to-digital converters. - Toshiki Arai; Toshio Yasue; Kazuya Kitamura; Hiroshi Shimamoto; Tomohiko Kosugi; Sung-Wook Jun; Satoshi Aoyama; Ming-Chieh Hsu; Yuichiro Yamashita; Hirofumi Sumi; Shoji Kawahito (ISSCC, 2016)

Development and Image Quality Evaluation of 8K High Dynamic Range Cameras with Hybrid Log-Gamma. - Ryohei Funatsu; Kazuya Kitamura; Toshio Yasue; Daiichi Koide; Hiroshi Shimamoto (IQSP, 2017)

A 33Mpixel CMOS imager with multi-functional 3-stage pipeline ADC for 480fps high-speed mode and 120fps low-noise mode. - Toshio Yasue; Kohei Tomioka; Ryohei Funatsu; Tomohiro Nakamura; Takahiro Yamasaki; Hiroshi Shimamoto; Tomohiko Kosugi; Sung-Wook Jun; Takashi Watanabe 003; Masanori Nagase; Toshiaki Kitajima; Satoshi Aoyama; et al. (ISSCC, 2018)

Noise suppression effect of folding-integration applied to a column-parallel 3-stage pipeline ADC in a 2.1 μm 33-megapixel CMOS image sensor. - Kohei Tomioka; Toshio Yasue; Ryohei Funatsu; Tomoki Matsubara; Tomohiko Kosugi; Sung-Wook Jun; Takashi Watanabe 003; Masanori Nagase; Toshiaki Kitajima; Satoshi Aoyama; Shoji Kawahito (IMSE, 2019)

Multi-Plane Phase Detection Autofocus for 8K Three-Chip Color Imaging Cameras. - Kodai Kikuchi; Ryohei Funatsu; Toshio Yasue; Kohei Tomioka; Tomoki Matsubara; Takayuki Yamashita (GCCE, 2020)

Noise Reduction Effect of Folding-integration ADC in an 8K Image Sensor driven at Various Frame Rates. - Kohei Tomioka; Toshio Yasue; Ryohei Funatsu; Kodai Kikuchi; Tomoki Matsubara; Takayuki Yamashita; Shoji Kawahito (IEEE SENSORS, 2020)

A 1st Order Incremental Sigma-Delta with Refined Digitally Implemented Feed-Forward for 2-stage ADC. - Toshio Yasue; Fortunato Frazzica; Annachiara Spagnolo; David San Segundo Bello; Maarten De Bock; Piet Wambacq; Jan Craninckx (IEEE SENSORS, 2020)