A 30-ns 64-Mb DRAM with built-in self-test and self-repair function. - Akira Tanabe; Toshio Takeshima; Hiroki Koike; Yoshiharu Aimoto; Masahide Takada; Toshiyuki Ishijima; Naoki Kasai; Hiromitsu Hada; Kentaro Shibahara; Takemitsu Kunio; Takaho Tanigawa; Takanori Saeki; et al. (IEEE J. Solid State Circuits, 1992)