ESD On-Wafer Characterization: Is TLP Still the Right Measurement Tool? - Mirko Scholz; Dimitri Linten; Steven Thijs; Sandeep Sangameswaran; Masanori Sawada; Toshiyuki Nakaei; Takumi Hasebe; Guido Groeseneken (IEEE Trans. Instrum. Meas., 2009)