Ultra Hi-Speed Pin-Electronics and Test Station Using GaAs IC. - Takashi Sekino; Toshiyuki Okayasu (ITC, 1994)

CMOS Circuit Technology for Precise GHz Timing Generator. - Toshiyuki Okayasu; Masakatsu Suda; Kazuhiro Yamamoto (ITC, 2002)

34.1Gbps Low Jitter, Low BER High-Speed Parallel CMOS Interface for Interconnections in High-Speed Memory Test System. - Daisuke Watanabe; Masakatsu Suda; Toshiyuki Okayasu (ITC, 2004)

CMOS high-speed, high-precision timing generator for 4.266-Gbps memory test system. - Masakatsu Suda; Kazuhiro Yamamoto; Toshiyuki Okayasu; Shusuke Kantake; Satoshi Sudou; Daisuke Watanabe (ITC, 2005)

1.83ps-Resolution CMOS Dynamic Arbitrary Timing Generator for >4GHz ATE Applications. - Toshiyuki Okayasu; Masakatsu Suda; Kazuhiro Yamamoto; Shusuke Kantake; Satoshi Sudou; Daisuke Watanabe (ISSCC, 2006)

Multi Strobe Circuit for 2.133GHz Memory Test System. - Kazuhiro Yamamoto; Masakatsu Suda; Toshiyuki Okayasu; Hirokatsu Niijima; Koichi Tanaka (ITC, 2006)

2GS/s, 10ps Resolution CMOS Differential Time-to-Digital Converter for Real-Time Testing of Source-Synchronous Memory Device. - Kazuhiro Yamamoto; Masakatsu Suda; Toshiyuki Okayasu (CICC, 2007)

CMOS optical 4-PAM VCSEL driver with modal-dispersion equalizer for 10Gb/s 500m MMF transmission. - Daisuke Watanabe; Atsushi Ono; Toshiyuki Okayasu (ISSCC, 2009)

Dynamic arbitrary jitter injection method for ≫6.5Gb/s SerDes testing. - Tasuku Fujibe; Masakatsu Suda; Kazuhiro Yamamoto; Yoshihito Nagata; Kazuhiro Fujita; Daisuke Watanabe; Toshiyuki Okayasu (ITC, 2009)

Real-time testing method for 16 Gbps 4-PAM signal interface. - Masahiro Ishida; Kiyotaka Ichiyama; Daisuke Watanabe; Masayuki Kawabata; Toshiyuki Okayasu (ITC, 2011)

30-Gb/s optical and electrical test solution for high-volume testing. - Daisuke Watanabe; Shin Masuda; Hideo Hara; Tsuyoshi Ataka; Atsushi Seki; Atsushi Ono; Toshiyuki Okayasu (ITC, 2013)