Decision-based virtual metrology for advanced process control to empower smart production and an empirical study for semiconductor manufacturing. - Chen-Fu Chien 001; Wei-Tse Hung; Chin-Wei Pan; Tran Hong Van Nguyen (Comput. Ind. Eng., 2022)

Bayesian decision analysis for optimizing in-line metrology and defect inspection strategy for sustainable semiconductor manufacturing and an empirical study. - Chen-Fu Chien 001; Tran Hong Van Nguyen; Yi-Chiu Li; Ying-Jen Chen (Comput. Ind. Eng., 2023)

Digital transformation for cost estimation system via meta-learning and an empirical study in aerospace industry. - Tran Hong Van Nguyen; Pei-Min Huang; Chen Fu Chien 001; Chung-Kai Chang (Comput. Ind. Eng., 2023)

Semiconductor probe card proactive maintenance using graph self-supervised learning and an empirical study. - Tran Hong Van Nguyen; Chen Fu Chien 001 (Comput. Ind. Eng., 2025)