Comparison of Electrical and Reliability Characteristics of Different Tunnel Oxides in SONOS Flash Memory. - Jia-Lin Wu; Hua-Ching Chien; Chien-Wei Liao; Cheng-Yen Wu; Chih-Yuan Lee; Houng-Chi Wei; Shih-Hsien Chen; Hann-Ping Hwang; Saysamone Pittikoun; Travis Cho; Chin-Hsing Kao (MTDT, 2006)