An overview of structured digital ASIC XPressArray©-II I/O. - Troy Ruud; Zhongmin Li; Rich Friel; Bryce Rasmussen; Shan Mo (CICC, 2005)

Solution to ESD Induced Pocket Isolation Failure in Multi Well CMOS. - Troy Ruud; Bryce Rasmussen; Bruce Greenwood; Matthew Tyler (CICC, 2007)