Test methodology for PCHB/PCFB Asynchronous Circuits. - Ting-Yu Shen; Chia-Cheng Pai; Tsai-Chieh Chen; James Chien-Mo Li; Samuel Pan (ITC, 2018)

DR-Scan: Dual-Rail Asynchronous Scan DfT and ATPG. - Shih-An Hsieh; Ying-Hsu Wang; Ting-Yu Shen; Kuan-Yen Huang; Chia-Cheng Pai; Tsai-Chieh Chen; James Chien-Mo Li (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019)

Clock-Less DFT and BIST for Dual-Rail Asynchronous Circuits. - Tsai-Chieh Chen; Chia-Cheng Pai; Yi-Zhan Hsieh; Hsiao-Yin Tseng; Chien-Mo James Li; Tsung-Te Liu; I-Wei Chiu (J. Electron. Test., 2021)

Feature Points based Residual UNet with Nonlinear Decay Rate for Partial Wet Fingerprint Restoration and Recognition. - An-Ting Hsieh; Ching-Te Chiu; Tsai-Chieh Chen; Mao-Hsiu Hsu; Wenyong Long (ISCAS, 2024)