An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration. - Xuan-Lun Huang; Jiun-Lang Huang; Hung-I Chen; Chang-Yu Chen; Tseng Kuo-Tsai; Ming-Feng Huang; Yung-Fa Chou; Ding-Ming Kwai (J. Electron. Test., 2012)