HZO-based Nonvolatile SRAM Array with 100% Bit Recall Yield and Sufficient Retention Time at 85°C. - Yusuke Shuto; Jun Okuno; Tsubasa Yonai; Ryo Ono; Peter Reinig; Maximilian Lederer; Konrad Seidel; Ruben Alcala; Thomas Mikolajick; Uwe Schroeder; Taku Umebayashi; Kentaro Akiyama (VLSI Technology and Circuits, 2024)