An efficient test-data compaction for low power VLSI testing. - Po-Han Wu; Tsung-Tang Chen; Wei-Lin Li; Jiann-Chyi Rau (EIT, 2008)

Test slice difference technique for low power encoding. - Wei-Lin Li; Tsung-Tang Chen; Po-Han Wu; Jiann-Chyi Rau (HLDVT, 2008)

New Scheme of Reducing Shift and Capture Power Using the X-Filling Methodology. - Tsung-Tang Chen; Wei-Lin Li; Po-Han Wu; Jiann-Chyi Rau (Asian Test Symposium, 2009)

The AB-filling methodology for power-aware at-speed scan testing. - Tsung-Tang Chen; Po-Han Wu; Kung-Han Chen; Jiann-Chyi Rau; Shih-Ming Tzeng (ITC, 2010)