AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects. - Tsung-Yeh Li; Shi-Yu Huang; Hsuan-Jung Hsu; Chao-Wen Tzeng; Chih-Tsun Huang; Jing-Jia Liou; Hsi-Pin Ma; Po-Chiun Huang; Jenn-Chyou Bor; Cheng-Wen Wu; Ching-Cheng Tien; Mike Wang (DFT, 2010)

AC-Plus Scan Methodology for Small Delay Testing and Characterization. - Tsung-Yeh Li; Shi-Yu Huang; Hsuan-Jung Hsu; Chao-Wen Tzeng; Chih-Tsun Huang; Jing-Jia Liou; Hsi-Pin Ma; Po-Chiun Huang; Jenn-Chyou Bor; Ching-Cheng Tien; Chi-Hu Wang; Cheng-Wen Wu (IEEE Trans. Very Large Scale Integr. Syst., 2013)