A ReRAM Macro Using Dynamic Trip-Point-Mismatch Sampling Current-Mode Sense Amplifier and Low-DC Voltage-Mode Write-Termination Scheme Against Resistance and Write-Delay Variation. - Chieh-Pu Lo; Wen-Zhang Lin; Wei-Yu Lin; Huan-Ting Lin; Tzu-Hsien Yang; Yen-Ning Chiang; Ya-Chin King; Chrong Jung Lin; Yu-Der Chih; Tsung-Yung Jonathon Chang; Meng-Fan Chang (IEEE J. Solid State Circuits, 2019)