Hardware Implementation of Prearranged Tables Based Modular Inversion. - Tsutomu Ishida; Yoshio Yoshioka; Tomoyuki Nagase (BWCCA, 2011)

Speed-path analysis for multi-path failed latches with random variation. - Tsutomu Ishida; Izumi Nitta; Katsumi Homma; Yuzi Kanazawa; Hiroaki Komatsu (ISQED, 2012)

A volume diagnosis method for identifying systematic faults in lower-yield wafer occurring during mass production. - Tsutomu Ishida; Izumi Nitta; Koji Banno; Yuzi Kanazawa (ASP-DAC, 2014)

Deep Learning-Based Wafer-Map Failure Pattern Recognition Framework. - Tsutomu Ishida; Izumi Nitta; Daisuke Fukuda; Yuzi Kanazawa (ISQED, 2019)