8Gbps CMOS pin electronics hardware macro with simultaneous bi-directional capability. - Shoji Kojima; Yasuyuki Arai; Tasuku Fujibe; Tsuyoshi Ataka; Atsushi Ono; Ken-ichi Sawada; Daisuke Watanabe (ITC, 2012)

30-Gb/s optical and electrical test solution for high-volume testing. - Daisuke Watanabe; Shin Masuda; Hideo Hara; Tsuyoshi Ataka; Atsushi Seki; Atsushi Ono; Toshiyuki Okayasu (ITC, 2013)