Wide-band 0.9 GHz to 4 GHz Four-Port Receiver. - Kamel Haddadi; Hassan El Aabbaoui; Christophe Loyez; David Glay; Nathalie Rolland; Tuami Lasri (ICECS, 2006)

Homodyne dual six-port network analyzer and associated calibration technique for millimeter wave measurements. - Kamel Haddadi; David Glay; Tuami Lasri (ISCAS, 2006)

Scanning Near-Field Millimeter-Wave Microscope: Application to a Vector-Coding Technique. - O. Benzaim; Kamel Haddadi; M. M. Wang; M. Maazi; David Glay; Tuami Lasri (IEEE Trans. Instrum. Meas., 2008)

Detection and Characterization of Buried Macroscopic Cracks Inside Dielectric Materials by Microwave Techniques and Artificial Neural Networks. - M. Maazi; O. Benzaim; David Glay; Tuami Lasri (IEEE Trans. Instrum. Meas., 2008)

Optimization of SiNX: H films deposited by PECVD for reliability of electronic, microsystems and optical applications. - Etienne Herth; Bernard Legrand; Lionel Buchaillot; Nathalie Rolland; Tuami Lasri (Microelectron. Reliab., 2010)

Performance of a Compact Dual Six-Port Millimeter-Wave Network Analyzer. - Kamel Haddadi; M. M. Wang; David Glay; Tuami Lasri (IEEE Trans. Instrum. Meas., 2011)

Investigation of optical and chemical bond properties of hydrogenated amorphous silicon nitride for optoelectronics applications. - Etienne Herth; H. Desré; Emmanuelle Algré; Christiane Legrand; Tuami Lasri (Microelectron. Reliab., 2012)

Interferometric technique for scanning near-field microwave microscopy applications. - Hind Bakli; Kamel Haddadi; Tuami Lasri (I2MTC, 2013)

Scanning Microwave Near-Field Microscope Based on the Multiport Technology. - Kamel Haddadi; Tuami Lasri (IEEE Trans. Instrum. Meas., 2013)

1-20 Ghz kΩ-range BiCMOS 55 nm reflectometer. - Pietro M. Ferreira; Cora Donche; Kamel Haddadi; Tuami Lasri; Gilles Dambrine; Christophe Gaquière; Thomas Quemerais; Daniel Gloria (NEWCAS, 2014)

Six-port technology for millimeter-wave radar and imaging applications. - Kamel Haddadi; Tuami Lasri (WiSNet, 2014)

Geometrical Optics-Based Model for Dielectric Constant and Loss Tangent Free-Space Measurement. - Kamel Haddadi; Tuami Lasri (IEEE Trans. Instrum. Meas., 2014)

On-wafer probe station for microwave metrology at the nanoscale. - Abdelhatif El Fellahi; Kamel Haddadi; Jaouad Marzouk; Steve Arscott; Christophe Boyaval; Tuami Lasri; Gilles Dambrine (I2MTC, 2015)

Measurement accuracy and repeatability in near-field scanning microwave microscopy. - Sijia Gu; Kamel Haddadi; Abdelhatif El Fellahi; Gilles Dambrine; Tuami Lasri (I2MTC, 2015)

Forward V-band vector network analyzer based on a modified six-port technique. - Kamel Haddadi; Tuami Lasri (WiSNet, 2015)

Setting Parameters Influence on Accuracy and Stability of Near-Field Scanning Microwave Microscopy Platform. - Sijia Gu; Kamel Haddadi; Abdelhatif El Fellahi; Tuami Lasri (IEEE Trans. Instrum. Meas., 2016)