Fault-Tolerant Design for VLSI: Effect of Interconnect Requirements on Yield Improvement of VLSI Designs. - Tülin Erdim Mangir; Algirdas Avizienis (IEEE Trans. Computers, 1982)

Yield of VLSI circuits: myths vs. reality (panel). - Andrzej J. Strojwas; Clark Beck; Dennis Buss; Tülin Erdim Mangir; Charles H. Stapper (DAC, 1986)