A Virtual Metrology Scheme for Predicting CVD Thickness in Semiconductor Manufacturing. - Tung-Ho Lin; Min-Hsiung Hung; Rung-Chuan Lin; Fan-Tien Cheng (ICRA, 2006)

Implementation Considerations of Various Virtual Metrology Algorithms. - Yu-Chuan Su; Tung-Ho Lin; Fan-Tien Cheng; Wei-Ming Wu (CASE, 2007)

Developing a selection scheme for dual virtual-metrology outputs. - Wei-Ming Wu; Fan-Tien Cheng; Deng-Lin Zeng; Tung-Ho Lin; Jyun-Fang Chen (CASE, 2008)

A novel key-variable sifting algorithm for virtual metrology. - Tung-Ho Lin; Fan-Tien Cheng; Aeo-Juo Ye; Wei-Ming Wu; Min-Hsiung Hung (ICRA, 2008)

Advanced studies of selection schemes for dual virtual-metrology outputs. - Wei-Ming Wu; Fan-Tien Cheng; Tung-Ho Lin; Deng-Lin Zeng; Jyun-Fang Chen; Min-Hsiung Hung (CASE, 2009)

Developing a dual-stage indirect virtual metrology architecture. - Wen-Huang Tsai; Fan-Tien Cheng; Wei-Ming Wu; Tung-Ho Lin (ICRA, 2010)

Selection Schemes of Dual Virtual-Metrology Outputs for Enhancing Prediction Accuracy. - Wei-Ming Wu; Fan-Tien Cheng; Tung-Ho Lin; Deng-Lin Zeng; Jyun-Fang Chen (IEEE Trans Autom. Sci. Eng., 2011)

A Novel CMII-Based Engineering Change Management Framework: An Example in Taiwan's Motorcycle Industry. - Wen-Hsiung Wu; Lung-Ching Fang; Tung-Ho Lin; Shen-Chou Yeh; Chin-Fu Ho (IEEE Trans. Engineering Management, 2012)