ATPG Based on a Novel Grid-Addressable Latch Element. - Susheel J. Chandra; Tom Ferry; Tushar Gheewala; Kerry Pierce (DAC, 1991)

For Test Automation, Silicon is Free. - Tushar Gheewala (ITC, 1991)

Use of CrossCheck test technology in practical applications. - Susheel J. Chandra; Tushar Gheewala; Hector R. Sucar; George Swan (VTS, 1991)

Delay Testing Using a Matrix of Accessible Storage. - Prab Varma; Tushar Gheewala (ITC, 1993)

The economics of scan-path design for testability. - Prab Varma; Tushar Gheewala (J. Electron. Test., 1994)

A Unifying Methodology for Intellectual Property and Custom Logic Testing. - Sandeep Bhatia; Tushar Gheewala; Prab Varma (ITC, 1996)