A memory yield improvement scheme combining built-in self-repair and error correction codes. - Tze-Hsin Wu; Po-Yuan Chen; Mincent Lee; Bin-Yen Lin; Cheng-Wen Wu; Chen-Hung Tien; Hung-Chih Lin; Hao Chen 053; Ching-Nen Peng; Min-Jer Wang (ITC, 2012)