Synthesized compact model and experimental results for substrate noise coupling in lightly doped processes. - Hai Lan; Tze Wee Chen; Chi On Chui; Parastoo Nikaeen; Jae Wook Kim; Robert W. Dutton (CICC, 2005)

Synthesized Compact Models and Experimental Verifications for Substrate Noise Coupling in Mixed-Signal ICs. - Hai Lan; Tze Wee Chen; Chi On Chui; Parastoo Nikaeen; Jae Wook Kim; Robert W. Dutton (IEEE J. Solid State Circuits, 2006)

Post-breakdown leakage resistance and its dependence on device area. - Tze Wee Chen; Choshu Ito; William Loh; Robert W. Dutton (Microelectron. Reliab., 2006)

Gate-Oxide Early Life Failure Prediction. - Tze Wee Chen; Kyunglok Kim; Young Moon Kim; Subhasish Mitra (VTS, 2008)

ESD design challenges and strategies in deeply-scaled integrated circuits. - Shuqing Cao; Tze Wee Chen; Stephen G. Beebe; Robert W. Dutton (CICC, 2009)

Gate-oxide early-life failure identification using delay shifts. - Young Moon Kim; Tze Wee Chen; Yoshio Kameda; Masayuki Mizuno; Subhasish Mitra (VTS, 2010)