A heuristic algorithm to minimize total weighted tardiness on a single machine with release times. - Fuh-Der Chou; Tzu-Yun Chang; Ching-En Lee (Int. Trans. Oper. Res., 2005)

A MIP model for IC final testing order selection problem. - Chun-Ying Huang; Amy Hsin-I Lee; Tzu-Yun Chang (MSV, 2008)