Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs. - Wenqi Zhang; Tzuo-Li Wang; Yan-hua Huang; Tsu-Ting Cheng; Shih-Yao Chen; Yiying Li; Chun-Hsiang Hsu; Chih-Jui Lai; Wen-Kuan Yeh; Yilin Yang (Microelectron. Reliab., 2016)