HTGB and DGS Reliability Assessment of e-mode GaN-HEMTs with Ferroelectric Gate Stack. - Andrea Natale Tallarico; M. Millesimo; U. Ibrar; Enrico Sangiorgi; Claudio Fiegna; T.-Y. Yang; J.-S. Wu; H. Iwai; E.-Y. Chang (IRPS, 2025)