Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure. - Young Pil Kim; U-In Chung; Joo Tae Moon; Sang U. Kim (Microelectron. Reliab., 2003)

Elimination of surface state induced edge transistors in high voltage NMOSFETs for flash memory devices. - Jin-Wook Lee; Gyoung Ho Buh; Guk-Hyon Yon; Tai-su Park; Yu Gyun Shin; U-In Chung; Joo Tae Moon (Microelectron. Reliab., 2005)

Enhancement of the effective viewing window for holographic display with amplitude-only SLM. - Geeyoung Sung; Jungkwuen An; Hong-Seok Lee; Sunil Kim; Hoon Song; Juwon Seo; Hojung Kim; Wontaek Seo; Chil-Sung Choi; U-In Chung (SD&A, 2015)